The purpose of this study was to use the x-ray diffractograms of Silicon crystallites of known sizes to determine their parameters for use in Scherrer's Formula. This formula allows for the determination of the size of crystallites in a polycrystalline sample. Data was procured through the application of copper-source x-rays onto silicon samples of different grain size, over a range of incident angles corresponding to known peak centers found using Braggs Law. Braggs Law was used to determine the locations of peaks for analysis and to verify the structure of the crystallites. This data was then analyzed to obtain specific peak characteristics: peak width, peak shape, peak height, half-width half-maximum. Using the experimental peak width and the known crystallite size, the constant in Scherrer's Formula was determined.
|Presenter:||Jordan McLeod (Undergraduate Student)|
|Location:||Seymour Union Main Lounge|
|Time:||1:15 pm Session III|