Thin Indium films are grown using vacuum vapor deposition. Film growth conditions can affect the film’s thickness and crystal size. Analyzing the possible correspondences between film growth environment and the physical characteristics of the films is important when studying a film’s electrical properties. Pressure values and film thickness are measured during the growth process in hopes to reveal effects of the vacuum environment. X-ray diffraction and Hall effect measurements are used to independently determine the grain size in the films. The mobility, grain size, and thickness are compared to other films grown under different conditions.
|Presenter:||Jeremy S. Mehta (Undergraduate Student)|
|Location:||Fireside Lounge, Seymour Union|
|Time:||9:30 am (Session I)
Please note that presentation times are approximate. If you are interested in attending sessions with multiple presentations, please be in the room at the start of the session.